Christiana Wornum
Pronouns: she, her, hers
Research Mentor(s): Ruby Wellen
Co-Presenter:
Research Mentor School/College/Department: Electrical Engineering / Engineering
Presentation Date: April 20
Presentation Type: Oral5
Session: Session 6 – 4:40pm – 5:30 pm
Room: Breakout room 4
Authors: Elaheh Ahmadi, Christiana Wornum, Ruby Wellen
Presenter: 2
Abstract
Which combination of Indium Gallium Nitride (InGaN) yielded samples of the most planate surface? What was the magnitude of the surface imperfections? How can we improve the analysis software to efficiently interpret these observations? These were all questions answered during my time on this project. Previously, samples were grown using different combinations of InGaN under a wide range of growing temperatures. Throughout my time working under Ruby Wellen, I was able to observe the development of samples of high-quality InGaN grown on N-Polar GaN substrates by Plasma-Assisted Molecular Beam Epitaxy. In analyzing this data we were able to find out which types of samples of InGan had the most optimal growing conditions using the Atomic Force Microscope (AFM). The AFM was an integral tool in closely examining the surface of the samples. We also improved the methods in which the data was viewed and analyzed by refining the programming of the viewing/analysis software. I was responsible for improving features of the analysis software, which generated graphical figures to show the samples’ InGan data. This research continues as more experimentation is required to find the most optimal growing conditions. These developments could be significant in the advancement of high-quality light emission technology.
Engineering
